- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/18 - Investigating the presence of defects or foreign matter
Patent holdings for IPC class G01N 23/18
Total number of patents in this class: 578
10-year publication summary
|
19
|
29
|
48
|
50
|
54
|
56
|
59
|
72
|
97
|
14
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Ishida Co., Ltd. | 509 |
38 |
| FUJIFILM Corporation | 27102 |
28 |
| Yxlon International GmbH | 50 |
12 |
| Toray Industries, Inc. | 6652 |
11 |
| Hamamatsu Photonics K.K. | 4161 |
11 |
| The Boeing Company | 19843 |
10 |
| Bruker Nano, Inc. | 334 |
10 |
| Job Corporation | 30 |
10 |
| Tracerco Limited | 76 |
10 |
| Illinois Tool Works Inc. | 11152 |
9 |
| Hitachi High-Tech Science Corporation | 326 |
9 |
| Anritsu Corporation | 380 |
9 |
| System Square Inc. | 24 |
8 |
| Xavis Co., Ltd. | 22 |
7 |
| Nissin Electronics Co., Ltd. | 7 |
7 |
| Tsinghua University | 5426 |
5 |
| CKD Corporation | 424 |
5 |
| Johnson Matthey Public Limited Company | 1852 |
5 |
| Nuctech Company Limited | 1275 |
5 |
| SVXR, Inc. | 10 |
5 |
| Other owners | 364 |